Semiconductor Engineering

Improve Logic Test With A Hybrid ATPG/BIST Solution

Two test strategies are used to test virtually all IC logic—automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a ...
Forbes

When A Logic Test Forgets Logic

This voice experience is generated by AI. Learn more. This voice experience is generated by AI. Learn more. About a decade ago, the college admissions world was surprised by the emergence of a new ...
Electronic Design

What’s The Difference Between ATPG And Logic BIST?

Two test strategies are used to test virtually all IC logic: automatic test pattern generation (ATPG) with test pattern compression and logic built-in self-test (BIST). This article will describe how ...
Electronic Design

Combining Logic BIST and Scan Test Compression

Small geometries have projected IC technology into an era where test has become a crucial part in the chip design process and have introduced new challenges needing solutions that use already ...
Hindustan Times

Logic test: Solve this tricky maths riddle to earn the title of brain teaser champion

Brain teasers are more than just fun distractions — they challenge logical reasoning, pattern recognition, and creative thinking. From school students to working professionals, many enjoy these ...